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| IGBT | ||
| Insulation Gate Bi-polar Transistor | ||
| Wafer with Back Metal Plating | ||
| Experimental use in Lab | ||
| For optimizing heat dissipation | ||
| EV (Electric Vehicle) and HEV (Hybrid Electric Vehicle) | ||
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| Part Numbering System | |||||||||
| TD | 1 | - | 12.5 | - | DC | - | BG150 | W | ### | 
| Wafer Material | Nbr Pads Per Die | Die Size (mm) | Patterns | Back Grind Die Thickness (µm) | Packaging | ID Number | |||
| Si Silicon: TD = Single Die TDW = Sawn Wafer TDWU = Unsawn Wafer GaN Gallium Nitride: GaN = Single Die GaNW = Sawn wafer GaNWU = Unsawn wafer SiC Silicon Carbide: SiC = Single Die SiCW = Sawn wafer SiCWU = Unsawn wafer | 1~999 | Square Example 5.0 = 5.0x5.0mm 12.5 = 12.5x12.5mm Other sizes available Rectangular Example: 8x5= X8mm x Y5mm 5x8= X5mm x Y8mm Other sizes available | DC = Daisy Chain BUS = Fully Plated ISO = Isolated Pads FA = Full Array Blank = Isolated or Fully Plated | 100µm ~500µm | Single Die: W = 2" Waffle Pack P = 4" Waffle Pack T = JEDEC Tray E = Tape & Reel Unsawn Wafer: C = Cassette J = Jar/Canister Sawn Wafer: NT8 = Dicing Tape 8" Ring NT12 = Dicing Tape 12" Ring UV8 = UV Tape 8" Ring UV12 = UV Tape 12" Ring | 3~6 Digit Unique Number | |||
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| Notes: Customer must complete questionnaire specifying wafer requirements such as: Wafer Material (Si, GaN or SiC), Wafer thickness (µm), Plating and Sputtering Alloys Plating Thickness, Back Grind Mesh Number, back-face laser annealing, etc | |||||||||
| IGBT Wafer/Die Questionnaire | ||||||
| Wafer Material: | [  ] Si Silicon | [  ] GaN Gallium Nitride | [  ] SiC Silicon Carbide | |||
| Die Size: | ________ mm x ________ mm | |||||
| Die Thickness: | ________ µm | |||||
| Back Grind Mesh: | [ ] #600 | Other ________ | ||||
| Layer 1: (sputter) | [ ] Ti | Other ________ | Layer 1 Thickness: | [ ] 1000Å | Other ________ | |
| Layer 2: (sputter) | [ ] Ni | Other ________ | Layer 2 Thickness: | [ ] 1000Å | Other ________ | |
| Layer 3: (plating) | [ ] Ni | Other ________ | Layer 3 Thickness: | [ ] 2.0 ~ 5.0µm | Other ________ | |
| Layer 4: (plating) | [   ] Au [ ] Sn | Other ________ | Layer 4 Thickness: | [ ] 0.1 ~ 0.3µm | Other ________ | |
| Wire Bond Pad: | [ ] None | [ ] Daisy Chain | Pad size _____ x ______µm | Nbr Pads ________ | Pad Pitch ________ µm | |
| Related Links: Wafer Test Die Dummy Die Flip Chip | |
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